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iruh3301 voltage regulator enhanced low dose rate sensitivity test report july 2010 international rectifier currently does not have a dscc approved radiation hardness assurance program for mil-prf-38534.
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 2 table of contents introduction .??????????????????. 3 summary of results ??????????????... 3 test method .?????????????????? 3 test plan .???????????????????. 3 test facility ??????????????????. 4 test results ...?????????????????. 5 conclusion .??????????????????...10 appendix a ? electrical data appendix b ? radiation test specification
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 3 introduction this test report covers the low dose rate tests performed on the iruh3301 low dropout linear regulator product line in a hermetic package. sinc e all part numbers within the iruh3301 product line contain the same active components, perform ance under radiation will be the same. the test was performed on ten samples from production lot h916391, which had completed mil-prf- 38534 ?k? level assembly and screening. on march 22, 2010 international rectifier completed low dose testing at the university of massachus etts, nuclear research facility using their co 60 source. summary of results all of the test samples passed the post radiation test requirements for total ionizing dose levels up to 100k rad(si). the results show no significant degradation for either of the bias conditions used during the irradiation for any of the parameters measured and no significant difference to the high dose rate results measured on october 28, 2009. test method the test method used as a guide in the developm ent of the test plan was mil-std-883, method 1019 ionizing radiation per condition d. this method establishes the basic requirements for the performance and execution of the tests. test plan the samples were exposed to co 60 irradiation in both an ?on? and ?off? biased state per the requirements of the test plan and the radiation test specification. post radiation testing of the devices occurred at the umass facility after each dose step was complete. the devices were tested between october 28, 2009 and march 22, 2010 at <=10 mrad(si) per second. the samples were removed from the radi ation chamber four times to collec t post radiation test results. on biased serial numbers: 68, 81, 76, 84, 59 (out puts fixed at 2.4v with 6.8v in and 10ma load) off biased serial numbers: 27, 88, 60, 5, 44 (in circuit with power off) control sample: 31 (not subjec ted to radiation or bias) the radiation test specification is included in appendix b. the testing occurred in the following manner: 1.0 purpose the purpose of this test is to characterize and qu alify the total ionizing dose effects for international rectifier?s hybrid low dropout regulator devices. the data resulting from the tests may be incorporated in the ir data sheet for the product. 2.0 test responsibility international rectifier shall be responsible for cond ucting the tests, which shall be performed at the university of massachusetts research reactor facility. in ternational rectifier shall be responsible for the final test report.
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 4 3.0 test facility 3.1 nuclear reactor the university of massachusetts research reactor shall be used to provide the source for gamma radiation. umrr will also prov ide information on dose rate, total dose, irradiation test times and dosimetry for this evaluation. 3.2 test equipment the necessary test equipment including interface board , cables, power supplies, measurement system, etc. shall be provided by international rectifier. 3.3 sample size sample size shall be determined based on device type, characterization parameters. as a minimum, the sample size shall meet the requirements of mil- pr f-38534. sample size for this eldrs evaluation equals 11 devices. five of the samples shall be biased with t he worst-case input voltage of 6.8 volts with the output fixed at 2.4v under a load of 10ma and five samples sha ll be biased ?in-circuit? with the power supply turned off. one sample shall be maintained as contro l and shall be tested at each dose step. 4.0 test devices 4.1 the following device is planned for total ionizing dose characterization: a. iruh3301a2ak 4.2 all devices shall be tested after each radiation exposure per t090176g within 1 hour and placed back on to radiation exposure within 2 hours. 5.0 test method mil-std-883, method 1019 condition d shall be used to establish the procedure for all testing described herein. 6.0 record keeping the reactor facility shall prov ide dosimetry data for the co 60 source. each exposure run shall be cataloged with the appropriate number in order to maintain correl ation to the appropriate data set. ir will be responsible for collecting and compiling the test data. 7.0 test report the test report shall include the following information: a. device type(s), serial numbers, wafer lot identification (per active component) b. test dates c. facility, source type d. bias conditions e. comments and observations f. pre and post electrical data g. summary descriptive includ ing graphs (when applicable) test facility the university of massachusetts, lowell, nuclear research reactor is a 1 mega-watt, uranium 235 enhanced core reactor. the umass lowell r adiation laboratory pr ovides controlled radiation environments and analytic al measurement services to government organizations and to industry. the laboratory provides facilities for proton, neutron, and gamma environments. the gamma cave is an irradiation room inside this facility having an equi-dimensional volume of 512
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 5 cubic feet. a wide range of dose rates, 1gray (100 rad) per hour to 10,000 gray (1 mrad) per hour, is available. several small ports penetra te one shielding wall to provide access for instrumentation cables. test results the raw test data for all the par ameters tested is shown in appen dix a. as outlined in the test plan, five of the devices exposed to low dose irradiation were biased ?on? with the maximum input voltage and five samples were placed in the bias circuit with the power supply off or biased ?off?. the results for the dropout voltag e parameter show wide fluctuati ons on both the control and test samples throughout the various test steps. based on this the test results for this parameter are considered to be a functional re sult rather than a precise resu lt. all samples passed the post radiation test requirements afte r exposure up to 100k rad(si). the percent change of the output voltage parameter test results versus radiation are shown in graphical format figures 1 thru 4. the output voltage did not change by more then 0.5% up to 100k rad(si) exposure. figure 1 vout 1 (vin=3.8v,io=50m a) - eldrs -0.500% -0.400% -0.300% -0.200% -0.100% 0.000% 0.100% 0.200% 0.300% 0.400% 0.500% 0 16 43 74 110 k rad ( si) % change of output voltage control ma x avg mi n
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 6 figure 2 vout 2 (vin=3.8v,io=3a) - eldrs -0.500% -0.400% -0.300% -0.200% -0.100% 0.000% 0.100% 0.200% 0.300% 0.400% 0.500% 0 164374110 k rad ( si) % change of output voltage control ma x avg mi n figure 3 vout 3 (vin=5.8v,io=50m a) - eldrs -0.500% -0.400% -0.300% -0.200% -0.100% 0.000% 0.100% 0.200% 0.300% 0.400% 0.500% 0 164374110 rad ( kr ad ) % change of output voltage control ma x avg mi n
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 7 figure 4 vout 4 (vin=5.8v,io=3a) - eldrs -0.500% -0.400% -0.300% -0.200% -0.100% 0.000% 0.100% 0.200% 0.300% 0.400% 0.500% 0 16 43 74 110 k rad ( si) % change of output voltage control ma x avg mi n
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 8 comparison of eldrs and tid results the results from the eldrs test were compared to the total ionizing dose 1 test results performed on the same manufacturer?s lot, h916391. a comparison of the output voltage for the product shows no significant difference in radiat ion response between the high and low dose rate tests. the radiation response fo r the output voltage par ameter test results for both the high and low dose rate tests are displayed in figures 5 thru 8. figure 5 vout 1 - (vin=3.8v,io=50ma) comparison of tid and eldrs response -0.300% -0.250% -0.200% -0.150% -0.100% -0.050% 0.000% 0.050% 0.100% 0.150% 0.200% 0.250% 0.300% 0 25 50 75 100 125 k rad(si) % change of output voltage tid a vg eldrs avg figure 6 vout 2 - (vin=3.8v,io=3a) comparison of tid and eldrs response -0.300% -0.250% -0.200% -0.150% -0.100% -0.050% 0.000% 0.050% 0.100% 0.150% 0.200% 0.250% 0.300% 0 25 50 75 100 125 k rad(si) % change of output voltage tid a vg eldrs avg 1 the data used for this comparison is documented in the total ionizing dose test report, july 2010.
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 9 figure 7 vout 3 - (vin=5.8v,io=50ma) comparison of tid and eldrs response -0.300% -0.250% -0.200% -0.150% -0.100% -0.050% 0.000% 0.050% 0.100% 0.150% 0.200% 0.250% 0.300% 0 25 50 75 100 125 k rad(si) % change of output voltage tid avg eldrs avg figure 8 vout 4 - (vin=5.8v,io=3a) comparison of tid and eldrs response -0.300% -0.250% -0.200% -0.150% -0.100% -0.050% 0.000% 0.050% 0.100% 0.150% 0.200% 0.250% 0.300% 0 25 50 75 100 125 k rad(si) % change of output voltage tid avg eldrs avg
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 10 conclusion the iruh3301 product has demonstrated hardness to lo w dose rate ionizing radiation exposure up to 100 krad(si) with no failures when device is in the ?on? or ?off? bias condition. furthermore when the low and high dose rate te st results were compared there were no measurable differences between the two.
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 11 appendix a electrical data
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 12 electrical test data (pre-radiation) rad level (k) vout (vin=3.8v,i o=50ma) vout (vin=3.8 v,io=3a) vout (vin=5.8v,i o=50ma) vout (vin=5.8 v,io=3a) over current latchup dropout voltage shutdown threshold on shutdown threshold off vout @ shutdown 0 3 4 5 6 7 9 10 11 12 min 2.462 2.462 2.462 2.462 3.5 0 0.8 0.8 -100 max 2.537 2.537 2.537 2.537 15 0.4 1.2 1.2 100 v v v v a v v v mv serial # 68 2.51 2.511 2.511 2.512 9.58 0.304 1.03 0.96 2.6 81 2.487 2.488 2.487 2.488 9.58 0.267 1.04 0.97 2.5 76 2.483 2.483 2.483 2.483 9.67 0.325 1.04 0.97 2.6 84 2.501 2.503 2.501 2.503 9.78 0.283 1.03 0.96 2.6 59 2.494 2.495 2.494 2.495 9.68 0.29 1.05 0.98 2.6 27 2.47 2.471 2.47 2.471 9.68 0.284 1.04 0.96 2.7 88 2.501 2.502 2.501 2.502 9.28 0.314 1.05 0.98 2.5 60 2.507 2.508 2.507 2.508 9.58 0.338 1.04 0.97 2.6 5 2.527 2.528 2.527 2.528 9.37 0.318 1.05 0.97 2.6 44 2.501 2.502 2.501 2.502 9.98 0.284 1.05 0.97 2.5 31 2.502 2.503 2.501 2.502 9.58 0.314 1.04 0.97 2.6 electrical test data (post radiation ?16k rad(si)) rad level (k) vout (vin=3.8v,i o=50ma) vout (vin=3.8 v,io=3a) vout (vin=5.8v,i o=50ma) vout (vin=5.8 v,io=3a) over current latchup dropout voltage shutdown threshold on shutdown threshold off vout @ shutdown 16 3.3 4.3 5.3 6.3 7.3 9.3 10.3 11.3 12.3 min 2.424 2.424 2.424 2.424 3.5 0 0.8 0.8 -100 max 2.537 2.537 2.537 2.537 15 0.4 1.2 1.2 100 v v v v a v v v mv serial # 68 2.51 2.511 2.51 2.511 9.48 0.335 1.03 0.96 2.5 81 2.487 2.488 2.488 2.488 9.68 0.327 1.04 0.97 2.4 76 2.484 2.485 2.484 2.485 9.48 0.3 1.04 0.97 2.6 84 2.502 2.503 2.502 2.504 9.67 0.282 1.03 0.96 2.7 59 2.495 2.496 2.495 2.496 9.77 0.29 1.05 0.98 2.6 27 2.471 2.472 2.471 2.472 9.58 0.283 1.04 0.96 2.5 88 2.499 2.5 2.499 2.5 9.08 0.346 1.05 0.98 2.5 60 2.507 2.508 2.507 2.508 9.48 0.367 1.04 0.97 2.6 5 2.532 2.533 2.532 2.532 9.48 0.284 1.05 0.97 2.7 44 2.502 2.503 2.502 2.504 9.57 0.372 1.05 0.98 2.6 31 2.499 2.5 2.499 2.5 9.58 0.316 1.04 0.97 2.6 device 31 is the control.
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 13 electrical test data (post radiation ? 43k rad(si)) rad level (k) vout (vin=3.8v,i o=50ma) vout (vin=3.8 v,io=3a) vout (vin=5.8v,i o=50ma) vout (vin=5.8 v,io=3a) over current latchup dropout voltage shutdown threshold on shutdown threshold off vout @ shutdown 43 3.3 4.3 5.3 6.3 7.3 9.3 10.3 11.3 12.3 min 2.424 2.424 2.424 2.424 3.5 0 0.8 0.8 -100 max 2.537 2.537 2.537 2.537 15 0.4 1.2 1.2 100 v v v v a v v v mv serial # 68 2.511 2.512 2.511 2.513 9.48 0.304 1.03 0.96 2.6 81 2.487 2.488 2.487 2.489 9.48 0.297 1.04 0.97 2.4 76 2.483 2.484 2.483 2.484 9.18 0.331 1.05 0.97 2.6 84 2.502 2.504 2.502 2.504 9.08 0.312 1.03 0.96 2.7 59 2.494 2.495 2.494 2.495 9.38 0.291 1.05 0.98 2.6 27 2.472 2.473 2.472 2.473 9.38 0.282 1.04 0.96 2.4 88 2.499 2.5 2.499 2.5 8.88 0.375 1.05 0.98 2.5 60 2.504 2.505 2.505 2.506 9.28 0.311 1.04 0.96 2.6 5 2.533 2.534 2.533 2.534 9.17 0.313 1.05 0.97 2.8 44 2.501 2.502 2.501 2.502 9.38 0.313 1.05 0.97 2.4 31 2.497 2.498 2.498 2.498 9.58 0.317 1.04 0.97 2.5 electrical test data (post radiation ? 74k rad(si)) rad level (k) vout (vin=3.8v,i o=50ma) vout (vin=3.8 v,io=3a) vout (vin=5.8v,i o=50ma) vout (vin=5.8 v,io=3a) over current latchup dropout voltage shutdown threshold on shutdown threshold off vout @ shutdown 74 3.3 4.3 5.3 6.3 7.3 9.3 10.3 11.3 12.3 min 2.424 2.424 2.424 2.424 3.5 0 0.8 0.8 -100 max 2.537 2.537 2.537 2.537 15 0.4 1.2 1.2 100 v v v v a v v v mv serial # 68 2.511 2.513 2.511 2.513 9.37 0.303 1.03 0.96 2.7 81 2.486 2.488 2.486 2.488 9.27 0.298 1.04 0.97 2.5 76 2.484 2.486 2.484 2.486 8.98 0.33 1.05 0.97 2.6 84 2.5 2.502 2.5 2.502 8.87 0.344 1.03 0.96 2.5 59 2.491 2.492 2.491 2.492 9.07 0.324 1.05 0.98 2.6 27 2.469 2.47 2.469 2.47 8.98 0.346 1.04 0.96 2.5 88 2.498 2.499 2.498 2.499 8.78 0.347 1.05 0.98 2.5 60 2.505 2.507 2.506 2.507 9.17 0.339 1.04 0.96 2.6 5 2.529 2.531 2.53 2.53 8.78 0.316 1.05 0.97 2.7 44 2.499 2.5 2.499 2.5 9.18 0.405 1.05 0.97 2.6 31 2.5 2.502 2.5 2.502 9.48 0.344 1.04 0.97 2.6 device 31 is the control.
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 14 electrical test data (post radiation ? 110k rad(si)) rad level (k) vout (vin=3.8v,i o=50ma) vout (vin=3.8 v,io=3a) vout (vin=5.8v,i o=50ma) vout (vin=5.8 v,io=3a) over current latchup dropout voltage shutdown threshold on shutdown threshold off vout @ shutdown 110 3.3 4.3 5.3 6.3 7.3 9.3 10.3 11.3 12.3 min 2.424 2.424 2.424 2.424 3.5 0 0.8 0.8 -100 max 2.537 2.537 2.537 2.537 15 0.4 1.2 1.2 100 v v v v a v v v mv serial # 68 2.509 2.51 2.509 2.511 9.08 0.336 1.03 0.96 2.6 81 2.485 2.486 2.485 2.486 9.18 0.299 1.04 0.97 2.6 76 2.49 2.493 2.49 2.493 9.07 0.353 1.05 0.97 2.6 84 2.5 2.502 2.5 2.502 8.68 0.374 1.03 0.96 2.6 59 2.49 2.491 2.49 2.491 8.98 0.324 1.05 0.98 2.6 27 2.469 2.471 2.469 2.47 8.98 0.315 1.04 0.96 2.5 88 2.498 2.499 2.498 2.499 8.69 0.348 1.05 0.98 2.6 60 2.506 2.508 2.506 2.508 8.98 0.368 1.04 0.96 2.7 5 2.534 2.535 2.534 2.535 8.68 0.341 1.05 0.97 2.7 44 2.499 2.5 2.499 2.5 9.17 0.346 1.05 0.97 2.6 31 2.497 2.498 2.498 2.498 9.77 0.287 1.04 0.97 2.6 device 31 is the control.
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 15 appendix b radiation test specification
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 16 table 1: pre radiation tests, 25c only prog. ref. test symbol test conditions rad level: notes min max units a output voltage vout vout (vin=3.8v,io=50ma) pre rad 2.462 2.537 v a output voltage vout vout (vin=3.8v,io=3a) pre rad 2.462 2.537 v a output voltage vout vout (vin=5.8v,io=50ma) pre rad 2.462 2.537 v a output voltage vout vout (vin=5.8v,io=3a) pre rad 2.462 2.537 v a dropout voltage vdrop io=3a pre rad 0.00 0.40 v a over current latchup ilatch vin=5.0v pre rad 3.50 15.00 a a shutdown threshold off vshdn vin=5.0v, vshutdown ramp from 0.5v to 2.0v, output monitored for a 1% drop below the nominal of vout. pre rad 0.80 1.20 v a shutdown threshold on vshdn vin=5.0v, vshutdown ramp from 2.0v to 0.5v, output monitored for 500mv of vout. pre rad 0.80 1.20 v a vout@ shutdown voshdn vin=5.0v, io=0a, shd=5.0v pre rad -0.10 0.10 v
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 17 table 2: post radiation tests, 25c only, all radiation levels prog. ref. test symbol test conditions rad level: notes min max units b output voltage vout vout (vin=3.8v,io=50ma) post rad 2.437 2.549 v b output voltage vout vout (vin=3.8v,io=3a) post rad 2.437 2.549 v b output voltage vout vout (vin=5.8v,io=50ma) post rad 2.437 2.549 v b output voltage vout vout (vin=5.8v,io=3a) post rad 2.437 2.549 v b dropout voltage vdrop io=3a post rad 0.00 0.40 v a over current latchup ilatch vin=5.0v post rad 3.50 15.00 a b shutdown threshold off vshdn vin=5.0v, vshutdown ramp from 0.5v to 2.0v, output monitored for a 1% drop below the nominal of vout. post rad 0.80 1.20 v b shutdown threshold on vshdn vin=5.0v, vshutdown ramp from 2.0v to 0.5v, output monitored for 500mv of vout. post rad 0.80 1.20 v b vout@ shutdown voshdn vin=5.0v, io=0a, shd=5.0v post rad -0.10 0.10 v
eldrs test report iruh3301 july 2010 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 18 dose step profile 1 10k, 10k, 30k, 50k 10k, 10k, 30k, 50k vin = 0v un biased dose rate range 0.01rad(si)/sec vin = 6.4v bias (80% of max voltage rating) n/a max = 100e-6 min = 50e-6 0.01rad(si)/sec 09-082-tf, 09-107-tf n/a board leakage low dose rate bias conditions board number 09-082-tf, 09-107-tf test temperature 25c +/-5c 25c +/-5c program card number n/a chamber hot cell hot cell 1. the dose step profile for low dose testing is for re ference only. this profile will vary depending on the facility availability to open the cell for interim tests. on bias off bias c26 100uf r9 120 u1 7 2 6 3 1 8 5 4 9 10 11 12 13 14 vin_a gnd_c vout_b shdn_f gnd_a vin_b vout_a adj nc_a nc_b nc_c nc_d nc_e nc_f r1 1k r5 120 c18 1.0uf c3 1.0uf c4 0.1uf c1 100uf c25 100uf c17 0.1uf c2 100uf vout1 vin+ r23 120 r19 120 c54 1.0uf c53 0.1uf u7 7 2 6 3 1 8 5 4 9 10 11 12 13 14 vin_a gnd_c vout_b shdn_f gnd_a vin_b vout_a adj nc_a nc_b nc_c nc_d nc_e nc_f r15 1k c43 0.1uf c44 1.0uf c41 100uf c61 100uf c42 100uf c62 100uf vout7 0v+

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